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Design of experiments approach to gradient estimation and its application to CMOS circuit stochastic optimization

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2 Author(s)
Zhang, J.C. ; Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA ; Styblinski, M.A.

A method using orthogonal array (OA)-based design of experiments is applied to screening and stochastic gradient evaluation for a generalized yield/Taguchi `loss' function and a general CMOS statistical model. In comparison with the Taguchi approach, the method does not require `inner' and `outer' table combinations. The method is shown to be much more efficient than an equivalent Monte Carlo approach on a practical CMOS circuit design example

Published in:

Circuits and Systems, 1991., IEEE International Sympoisum on

Date of Conference:

11-14 Jun 1991