Integrated model parameter extraction using large-scale optimization concepts

A robust approach to modelling parameter extraction in microwave circuit design is presented. The approach not only attempts to match DC and AC measurements under different bias conditions simultaneously, but also employs the DC characteristics of the device as constraints on Bias-dependent parameters, this improving the uniqueness and reliability of the solution. The approach is an expansion of the hierarchical modeling techniques recently proposed J.W. Bandler and S.H. Chen (1988). Based on J.W. Bandler and Q.J. Zhang's (1987) automatic decomposition concepts for large-scale optimization, a sequential model building method is proposed which can be combined with powerful l/sub 1/ optimization techniques to establish a model with simple topology and sufficient accuracy. Practical FET models are used to illustrate the formulation. A detailed numerical example is presented to show the effectiveness of the approach.<>