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Extension of the E-plane scanning range in large microstrip arrays by substrate modification

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1 Author(s)
Davidovitz, M. ; Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA

The effect of the substrate structure modification on the E-plane scanning performance in large microstrip arrays is studied with the aid of a two-dimensional model. The goal is to alleviate scan blindness effects. The finite-element method of lines is used to solve the electromagnetic equations, thus demonstrating its applicability to open, periodic structures.<>

Published in:

Microwave and Guided Wave Letters, IEEE  (Volume:2 ,  Issue: 12 )

Date of Publication:

Dec. 1992

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