By Topic

New wideband optical modulation method for measurement of intrinsic frequency response in semiconductor lasers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Murata, S. ; NEC Corp., Tsukuba, Japan ; Suzuki, A.

A new wideband optical modulation method is described for measurement of the intrinsic frequency response is semiconductor lasers. The measurement bandwidth is more than 40 GHz. The main feature of the method is the detection technique which uses a microwave detector and a lock-in amplifier. The 3 dB modulation bandwidth for a 1.5 mu m strained multiquantum well laser measured by this method is 28 GHz.

Published in:

Electronics Letters  (Volume:28 ,  Issue: 23 )