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Novel microwave reflectometer for accurate characterisation of high-speed photodiode optoelectronic response

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2 Author(s)
Humphreys, D.A. ; NPL, Teddington, UK ; Gifford, A.D.

A reflectometer technique which corrects source-mismatch errors using scalar optoelectronic measurements alone is demonstrated. Results corrected using voltage-reflection-coefficient (VRC) measurements of both the photodiode and measurement system are compared with those determined by the new technique for a GaInAs photodiode measured to 40 GHz by a 1.5 mu m DFB laser heterodyne system. The optoelectronic response determined by the new technique falls within the scatter of the VRC corrected measurements.

Published in:

Electronics Letters  (Volume:28 ,  Issue: 23 )

Date of Publication:

5 Nov. 1992

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