Cart (Loading....) | Create Account
Close category search window

Novel microwave reflectometer for accurate characterisation of high-speed photodiode optoelectronic response

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Humphreys, D.A. ; NPL, Teddington, UK ; Gifford, A.D.

A reflectometer technique which corrects source-mismatch errors using scalar optoelectronic measurements alone is demonstrated. Results corrected using voltage-reflection-coefficient (VRC) measurements of both the photodiode and measurement system are compared with those determined by the new technique for a GaInAs photodiode measured to 40 GHz by a 1.5 mu m DFB laser heterodyne system. The optoelectronic response determined by the new technique falls within the scatter of the VRC corrected measurements.

Published in:

Electronics Letters  (Volume:28 ,  Issue: 23 )

Date of Publication:

5 Nov. 1992

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.