Close category search window
 

Characterization of Carbonaceous Impurity Level in As-Produced Single-Walled Carbon Nanotubes by Using Solution-Phase Spectrophotometry

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Han, Xuliang ; Brewer Science, Inc., 2401 Brewer Drive, Rolla, Missouri 65401, United States, xhan@brewerscience.com

This paper describes a simple experimental procedure and a practical data analysis method for characterizing the concentration of carbonaceous impurities in the as-produced single-walled carbon nanotubes (SWNTs). This procedure starts with dispersing solid as-produced SWNT soot in an aqueous surfactant solution, namely sodium dodecyl sulfate (SDS), by using a sonicator. Then the optical absorption spectrum of this SWNT/SDS suspension is measured in the visible and the near-infrared regions (12500 cm-1-25000 cm-1) at a spectral resolution of 1 nm by using a spectrophotometer. The obtained spectrum features a pronounced superposition of multiple sharp peaks originating from the inter-band transitions in the electronic density of states (DOS) of the SWNTs and a broad baseline originating from the π-plasmon activities in both SWNTs and carbonaceous impurities. A practical method is proposed for use to analyze the obtained spectral data, and a numerical indicator, CIL (Carbonaceous Impurity Level), is defined as a figure of merit for comparing different as-produced SWNT samples. The validity of CIL is supported by the experimental results.

Published in:
Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on  (Volume:2 )

Date of Conference: 17-20 June 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.