The growth of epitaxial strained silicon-carbon alloys are of great interest for use in the source-drain regions of MOSFETs to induce tensile strain in channel regions to enhance electron carrier mobility. In this work, the growth of epitaxial Si1-yCy alloys by chemical vapor deposition with high substitutional carbon fractions (y~1.8%) and extremely high growth rates at 575degC (~20nm/min) are reported. The high growth rates are enabled by a novel high-order silane (HOS) silicon precursor
Published in:
SiGe Technology and Device Meeting, 2006. ISTDM 2006. Third International
Date of Conference: 15-17 May 2006