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Efficient Interconnect Test Patterns for Crosstalk and Static Faults

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5 Author(s)
Pyoungwoo Min ; Dept. of Electr. Eng. & Comput. Sci., Hanyang Univ., Kyunggi-Do ; Hyunbean Yi ; Jaehoon Song ; Sanghyeon Baeg
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This paper introduces effective test patterns for system-on-chip and board interconnects. Initially, "6n" patterns are introduced to completely detect and diagnose both static and crosstalk faults, where "n" is the total number of interconnect nets. Then, more economic "4n+1" patterns are described to test the crosstalk faults for the interconnect nets separated within a certain distance

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:25 ,  Issue: 11 )