Efficient Interconnect Test Patterns for Crosstalk and Static Faults

This paper introduces effective test patterns for system-on-chip and board interconnects. Initially, “
$6n$
” patterns are introduced to completely detect and diagnose both static and crosstalk faults, where “
$n$
” is the total number of interconnect nets. Then, more economic “
$4n + 1$
” patterns are described to test the crosstalk faults for the interconnect nets separated within a certain distance.