Cart (Loading....) | Create Account
Close category search window
 

Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse-Order Restoration and Test Relaxation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
El-Maleh, A.H. ; Dept. of Comput. Eng., King Fahd Univ. of Pet. & Miner., Dhahran ; Khursheed, S.S. ; Sait, S.M.

The authors present efficient reverse-order-restoration (ROR)-based static test compaction techniques for synchronous sequential circuits. Unlike previous ROR techniques that rely on vector-by-vector fault-simulation-based restoration of test subsequences, the authors' technique restores test sequences based on efficient test relaxation. The restored test subsequence can be either concatenated to the compacted test sequence, as in previous approaches, or merged with it. Furthermore, it allows the removal of redundant vectors from the restored subsequences using a state traversal technique and incorporates schemes for increasing the fault coverage of restored test subsequences to achieve an overall higher level of compaction. In addition, test relaxation is used to take ROR out of saturation. Experimental results demonstrate the effectiveness of the proposed techniques

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:25 ,  Issue: 11 )

Date of Publication:

Nov. 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.