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Improved n -Detection Test Sequences Under Transparent Scan

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2 Author(s)
Pomeranz, I. ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN ; Reddy, S.M.

The quality of test sequences for scan circuits under a test-application scheme called transparent scan as n-detection test sequences is studied. A transparent-scan sequence T is obtained from a compact single-detection combinational test set C. It is shown that for the same number of clock cycles required to apply C, the transparent-scan sequence T detects faults more times than C. It is also noted that a transparent-scan sequence based on a combinational test set contains unspecified values. The effects of specifying the unspecified values of the transparent-scan sequence on the quality of the sequence are studied by considering a random specification of these values. A procedure for modifying the scan-select subsequence of a (fully specified) transparent-scan sequence so as to improve its quality as an n-detection test sequence is also described. Finally, the extension of a transparent-scan test sequence into an n-detection test sequence that detects every target fault at least n times is considered. The results show a slower increase in test-application time with n than when combinational test sets are considered

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:25 ,  Issue: 11 )

Date of Publication:

Nov. 2006

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