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Quantifying electric and magnetic field coupling from integrated circuits with TEM cell measurements

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4 Author(s)
V. Kasturi ; University of Missouri-Rolla ; S. Deng ; T. Hubing ; D. Beetner

First Page of the Article

Published in:

2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006.  (Volume:2 )

Date of Conference:

14-18 Aug. 2006