By Topic

Interaction of an Open-Ended Rectangular Waveguide Probe With an Arbitrary-Shape Surface Crack in a Lossy Conductor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mazlumi, F. ; Civil Aviation Technol. Coll., Tehran ; Sadeghi, S.H.H. ; Moini, R.

This paper presents a modeling technique to predict the output signal of an open-ended rectangular waveguide probe when scanning an arbitrary-shape crack in a lossy conductor with finite conductivity. The loss of the specimen is taken into account by using surface impedance at the surface. The technique discretizes the crack shape and applies the generalized scattering matrix technique to obtain the output signal. To validate the model proposed in this paper, the results of the proposed method are compared with the measurement results and those obtained using a finite-element code. The model is used to obtain appropriate inversion curves for determining crack depth measurement from the probe output signal

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:54 ,  Issue: 10 )