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Highly Manufacturable 45nm LSTP CMOSFETs Using Novel Dual High-k and Dual Metal Gate CMOS Integration

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17 Author(s)

This paper reports the first demonstration of dual high-k and dual metal gate (DHDMG) CMOSFETs meeting the device targets of 45nm low stand-by power (LSTP) node. This novel scheme has several advantages over the previously reported dual metal gate integration, enabling the high-k and metal gate processes to be optimized separately for N and PMOSFETs in order to maximize performance gain and process controllability. The proposed gate stack integration results in a symmetric short channel Vt of ~plusmn0.45V with >80% high field mobility for both N and PMOSFETs and significantly lower gate leakage compared to poly/SiON stack

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2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.

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