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Switching Field Distribution of CoPtCr-SiO _2 Perpendicular Recording Media Obtained by Subtracting Thermal Agitation of Magnetization

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7 Author(s)
Shimatsu, T. ; Res. Inst. of Electr. Commun., Sendai ; Kondo, T. ; Mitsuzuka, K. ; Watanabe, S.
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The effect of thermal agitations on the switching field distribution (SFD) of CoPtCr-SiO2 perpendicular media was investigated, and the "intrinsic" SFD caused by variations in the grain-to-grain switching field was determined. DC demagnetizing (DCD) magnetization curves and minor DCD (M-DCD) magnetization curves were measured at applied field-sweep rates of ~10 Oe/s and ~108 Oe/s. We estimated the SFD from the difference between the DCD and M-DCD curves, and defined them as DeltaHr/Hr (at ~10 Oe/s) and DeltaHr P/Hr P (at ~108 Oe/s). The values of DeltaHr/Hr were much larger than those of DeltaHr P/Hr P. Moreover, DeltaHr/Hr increased faster than DeltaHr P/Hr P as the thickness decreased, suggesting that the SFD measured at vibrating sample magnetometer (VSM) time scales is significantly influenced by thermal agitation. The intrinsic SFD estimated using a series of media with various film thicknesses was about 0.14, which was 55%-75% of DeltaHr/Hr for 8-16-nm-thick media. An analysis of the temperature dependence of DeltaHr/Hr supported this conclusion. It is concluded that the SFD measured at VSM time scales is significantly influenced by thermal agitation of the magnetization, and the intrinsic SFD is likely to be nearly half that measured at VSM time scales

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Magnetics, IEEE Transactions on  (Volume:42 ,  Issue: 10 )