Cart (Loading....) | Create Account
Close category search window
 

The Implementation of Run-Time Diagnostics in Pascal

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Fischer, Charles N. ; Department of Computer Science, University of Wisconsin ; LeBlanc, R.J.

This paper considers the role of run-time diagnostic checking in enforcing the rules of the Pascal programming language. Run-time diagnostic checks must be both complete (covering all language requirements) and efficient. Further, such checks should be implemented so that the cost of enforcing the correct use of a given construct is borne by users of that construct. This paper descxibes simple and efficient mechanisms currently in use with a diagnostic Pascal compiler that monitor the run-time behavior of such sensitive Pascal constructs as pointers, variant records, reference (i.e., var) parameters, and with statements. The use of these mechanisms with related constructs in other languages is considered. Language modifications that simplify run-time checking ate also noted.

Published in:

Software Engineering, IEEE Transactions on  (Volume:SE-6 ,  Issue: 4 )

Date of Publication:

July 1980

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.