By Topic

A Test Design Methodology for Protocol Testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
B. Sarikaya ; Department of Electrical Engineering, Concordia University ; G. v. Bochmann ; E. Cerny

Communication protocol testing can be done with a test architecture consisting of remote Lower Tester and local Upper Tester processes. For real protocols, tests can be designed based on the formal specification of the protocol which uses an extended finite state machine model. The specification is transformed into a simpler form consisting of normal form transitions. It can then be modeled by a control and a data flow graph. The graphs are decomposed into subtours and data flow functions, respectively. Tests are designed by considering parameter variations of the input primitives of each data flow function and determining the expected outputs. The methodology gives complete test coverage of all data flow functions and control paths in the specification. Functional fault models are proposed for functions that are not formally specified.

Published in:

IEEE Transactions on Software Engineering  (Volume:SE-13 ,  Issue: 5 )