Cart (Loading....) | Create Account
Close category search window

Implementing Distributed Read-Only Transactions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chan, A. ; Computer Corporation of America, 4 Cambridge Center ; Gray, R.

This paper presents an efficient scheme for eliminating conflicts between distributed read-only transactions and distributed update transactions, thereby reducing synchronization delays. The scheme makes use of a multiversion mechanism in order to guarantee that distributed read-only transactions see semantically consistent snap-shots of the database, that they never have to be rolled-back due to their late arrival at retrieval sites, and that they inflict minimal synchronization delays on concurrent update transactions. Proof that the presented scheme guarantees semantic consistency is provided. Two important by-products of this scheme are that the recovery from transaction and system failures is greatly simplified and the taking of database dumps also can be accommodated while leaving the database on-line.

Published in:

Software Engineering, IEEE Transactions on  (Volume:SE-11 ,  Issue: 2 )

Date of Publication:

Feb. 1985

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.