Cart (Loading....) | Create Account
Close category search window
 

Software Reliability Growth Modeling: Models and Applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yamada, Shigeru ; Graduate School of Systems Science, Okayama University of Science ; Osaki, S.

This paper summarizes existing software reliability growth models (SRGM's) described by nonhomogeneous Poisson processes. The SRGM's are classified in terms of the software reliability growth index of the error detection rate per error. The maximum-likelihood estimations based on the SRGM's are discussed for software reliability data analysis and software reliability evaluation. Using actual software error data observed by software testing, application examples of the existing SRGM's are illustrated.

Published in:

Software Engineering, IEEE Transactions on  (Volume:SE-11 ,  Issue: 12 )

Date of Publication:

Dec. 1985

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.