By Topic

Facial Feature Selection Based on SVMs by Regularized Risk Minimization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Weihong Li ; Key Lab of Optoelectronic Technol., Chongqing Univ. ; Weiguo Gong ; Liping Yang ; Weimin Chen
more authors

In this paper we present a method based on SVMs by regularized risk minimization for the facial feature selection aiming at improving performance of the classifier by (1) using WT + KPCA as filter approach to choose a set of more meaningful representatives to replace the original data for feature selection; (2) using SVM RFE iterative procedure as wrapper approach to obtain the optimum feature subset; (3) using regularized risk minimization as feature selection ranking criterion. Experimental results on FERET face database subsets indicate that the proposed method has a significant improvement in the classification accuracy and speed

Published in:

Pattern Recognition, 2006. ICPR 2006. 18th International Conference on  (Volume:3 )

Date of Conference:

0-0 0