Close category search window
 

Feature Extraction for Bank Note Classification Using Wavelet Transform

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Euisun Choi ; Fundamental Tech. Res., Nautilus Hyosung Inc., Seoul ; Jongseok Lee ; Joonhyun Yoon

In this paper, we investigate an approach to feature extraction for bank note classification by exploiting the potential of wavelet transform. In the proposed method, high spatial frequency coefficients taken from the wavelet domain are examined to extract features. We first perform edge detection on bill images to facilitate the wavelet feature extraction. The construction of feature vectors is then conducted by thresholding and counting of wavelet coefficients. The proposed feature extraction method can be applied to classifying any kind of bank note. However, in this paper we examine Korean won bills of 1000, 5000 and 10000 won types. Experimental results with a set of 10,800 bill images show that the proposed feature extraction method provides a correct classification rate of 99% even by using the Euclidean minimum distance matching as classifier

Published in:
Pattern Recognition, 2006. ICPR 2006. 18th International Conference on  (Volume:2 )

Date of Conference: 0-0 0

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.