By Topic

New RHT-Based Ellipsoid Recovery Method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chunguang Cao ; Dept. of Comput. Sci., Alabama Univ., Huntsville, AL ; Newman, T.S.

A new method that enables randomized Hough transform (RHT)-based recovery of ellipsoid parameters from a collection of 3D points is presented. The approach is attractive since it can alleviate the traditional Hough transform's disadvantages of large computation time and memory usage - in particular for the ellipsoid detection's high-dimensional parameter space. The new method uses two RHT-based stages, first exploiting shape to enable recovery of position and then exploiting eigen analysis to recover the remaining parameters (of shape and orientation). Experimental results on synthetic and real data are also presented

Published in:

Pattern Recognition, 2006. ICPR 2006. 18th International Conference on  (Volume:1 )

Date of Conference:

0-0 0