By Topic

Analogue Studies of Losses in Reflex Oscillator Cavities

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Schott, F.W. ; University of California, Los Angeles, Calif.; now on leave with the U. S. Navy Electronics Laboratory, San Diego, Calif. ; Spangenberg, K.R.

An analysis is made which shows the method of applying the network analogue to the investigation of the effect of dielectric and wall losses on cavity-resonator behavior. The Q and shunt resistance of re-entrant cavities operating in the first- and second-order TM0type modes are investigated. The condition for a zero of shunt resistance is determined. Experimental resuilts are discussed.

Published in:

Proceedings of the IRE  (Volume:37 ,  Issue: 12 )