By Topic

A Bayesian approach to parameter selection for simulated annealing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
B. Stuckman ; Dept. of Electr. Eng., Louisville Univ., KY, USA ; D. Jett

The authors present a hybrid method of global optimization which uses Bayesian global optimization to choose the parameters of a simulated annealing method, specifically, the initial and final temperatures. This removes the burden on the user for the choice of these values and allows the search to progress optimally. The properties of the Bayesian and simulated annealing algorithms are discussed. A new hybrid algorithm is introduced and selected results on standard test functions are presented

Published in:

Systems, Man, and Cybernetics, 1991. 'Decision Aiding for Complex Systems, Conference Proceedings., 1991 IEEE International Conference on

Date of Conference:

13-16 Oct 1991