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A broadcast-based test scheme for reducing test size and application time

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3 Author(s)
Jiann-Chyi Rau ; Dept. of Electr. Eng., Tamkang Univ., Taipei, Taiwan ; Jun-Yi Chang ; Chien-Shiun Chen

We present efficient method for reducing test application time by broadcasting test configuration. We compare our method based on single, multiple, 1-1 in-order mapping, even distribution, nearest signal probability matching, and in-order pseudo-exhaustive method. The results of our experiments indicate that our method reducing the test pattern number and the test application time by running the ATPG tool provided by SIS

Published in:

2006 IEEE International Symposium on Circuits and Systems

Date of Conference:

21-24 May 2006