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A 4-Gb/s/pin current mode 4-level simultaneous bidirectional I/O with current mismatch calibration

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3 Author(s)
Yong Sin Kim ; Dept. of Electr. Eng., California Univ., Santa Cruz, CA ; Sangho Shin ; Sung-Mo Kang

This paper describes a high speed current mode multilevel simultaneous bi-directional I/O which calibrates pin-to-pin current mismatch. Output impedance is controlled by an impedance matching circuit reducing process variation down to plusmn2.5%. Maximum 20% pin-to-pin current mismatch is reduced to 1.25% by 4-bit digital calibration scheme. Simulation results based on 0.18mum CMOS process show that the proposed design achieves 4-Gb/s/pin data rate with 512ps timing window and 27mV voltage window. I/O circuits consume 12mW/pin at a supply voltage of 1V

Published in:

Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on

Date of Conference:

21-24 May 2006