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An Ultra-High-Frequency Measuring Assembly

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1 Author(s)
Sabaroff, Samuel ; Moore School of Electrical Engineering, University of Pennsylvania, Philadelphia, Pennsylvania

A system for measuring the ultra-high frequencies is described. The general requirements of such a system are similar to those usually necessary for measurements at the lower frequencies; i.e., (1) a standard frequency source, (2) a method for generating standard harmonics and their subdivisions, and (3) a means for locating a signal with respect to these harmonics. The accuracy of the laboratory arrangement described was about one in fifty thousand at a frequency of 180 megacycles. An elaboration of this equipment should allow the accuracy of a secondary standard to be attained. A by-product of this investigation was a simple method for calibrating a Lecher frame, which is described in Appendix B.

Published in:

Proceedings of the IRE  (Volume:27 ,  Issue: 3 )