Cart (Loading....) | Create Account
Close category search window
 

Inductively Compensated Parallel Coupled Microstrip Lines and Their Applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Phromloungsri, R. ; Applications & Telecommun. Dept., Mahanakorn Univ. of Technol., Bangkok ; Chongcheawchamnan, M. ; Robertson, Ian D.

A simple method using lumped inductors to compensate unequal even- and odd-mode phase velocities in parallel coupled microstrip lines is presented. The singly and doubly compensated cases are analyzed to enable the optimum inductor values and the electrical lengths of the compensated coupled lines to be calculated from closed-form expressions. The technique proposed not only improves the performance, but also yields a more compact design. To demonstrate the technique's broad range of applicability, the compensated coupled-line structure is used to enhance the performance of a 900-MHz Lange coupler, a 1-GHz multisection 10-dB coupler, a 900-MHz planar Marchand balun, and a 1.8-GHz parallel coupled bandpass filter

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:54 ,  Issue: 9 )

Date of Publication:

Sept. 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.