By Topic

Verification of the GREAT Total Data Readout System Using Pseudo Random Pattern Generator

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Coleman-Smith, P.J. ; Nucl. Phys. Group, Daresbury Lab., Warrington

Total Data Readout (TDR) is a powerful data acquisition tool developed for use with Recoil Decay Tagging (RDT) experiments on the GREAT (Gamma, Recoil, Electron, Alpha Tagging) spectrometer. RDT experiments correlate prompt radioactive decays detected at the target position with subsequent decays of recoiling reaction products implanted in GREAT, located at the focal plane of the RITU recoil separator, several microseconds later. TDR uses independent channels associated in a software event builder based on timestamps to form a single time ordered data stream. It is crucial to maintain the accuracy of the timestamps over long periods (microseconds to hours) for the study of Exotic Nuclei. The TDR system cannot be tested fully by use of calibrated sources with GREAT and a novel method of verifying the system is required. Our solution is to use the predictable randomness of a Pseudo Random Number generator based on Linear Feedback Shift Registers (LFSR) implemented in a 16 channel VME module. The random value defines the delay between pulses into the TDR system. The recorded results are sorted and checked for correspondence with the LFSR sequence. We show the method, design of the module, and discuss the results and benefits of the tests

Published in:

Nuclear Science, IEEE Transactions on  (Volume:53 ,  Issue: 4 )