Cart (Loading....) | Create Account
Close category search window

A Model for the Geostationary Electron Environment: POLE, From 30 keV to 5.2 MeV

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)

In 2003, a model for the geostationary electron environment: POLE (Particle ONERA-LANL Environment) has been developed at ONERA/DESP. This model is based on the full complement of Los Alamos National Laboratory geostationary satellites, covers the period 1976-2001 and is valid from 30 keV up to 2.5 MeV and takes into account the solar cycle variation. Over the period 1976 to present, three different detectors were flown: CPA (Charged Particle Analyzer), SOPA (Synchronous Orbit Particle Analyzer) and ESP (Energetic Spectra for Particles). The first two were studied to develop the first version of POLE (up to 2.5 MeV). Here, in order to extend the energy coverage of the model, we analyze the data of the third detector: ESP, where the electron detection covers the range 0.7 MeV-25.8 MeV. The new version thus obtained cover energies from 30 keV up to 5.2 MeV

Published in:

Nuclear Science, IEEE Transactions on  (Volume:53 ,  Issue: 4 )

Date of Publication:

Aug. 2006

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.