Cart (Loading....) | Create Account
Close category search window

A bayesian approach to reliability demonstration for aerospace systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yates, S.W. ; Dept. of Mech. Eng., Maryland Univ., College Park, MD ; Mosleh, A.

This paper presents practical methods for utilizing Bayesian techniques to improve the accuracy of reliability demonstration during acquisition of aerospace systems. The approach focuses on simple methods that can be implemented with basic knowledge of Bayesian procedures and without specialist software packages. Conjugate distributions are employed to allow rapid computation of posterior distributions for three cases: (1) probability of success in a binomial process, (2) mean time between failure with an underlying exponential distribution and (3) mean time between failure with an underlying Weibull distribution. Additionally, a method is introduced to allow partially relevant data to be introduced into the analysis with an appropriate weight applied. Possible expansions are considered for cases where more experienced analysts and better tools are available. Finally, examples of the process based on representative data are provided for both a probability of success and mean time between failure problem

Published in:

Reliability and Maintainability Symposium, 2006. RAMS '06. Annual

Date of Conference:

23-26 Jan. 2006

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.