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Linear Dependencies in Linear Feedback Shift Registers

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1 Author(s)
Chen, C.L. ; IBM

Linear feedback shift registers have been proposed to generate test patterns for the self-test of logic networks. The probability of linear dependence among k bit positions of a subset of k bits in a maximum length shift register sequence is an outstanding problem. In this correspondence, we derive a formula for the calculation of the probability.

Published in:

Computers, IEEE Transactions on  (Volume:C-35 ,  Issue: 12 )