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In this correspondence, we present procedures for constructing universal fault detection test sets as well as fault location test sets for multivalued linear circuits, under a multiple stuck-fault model. The bin packing problem is involved in the procedures. The sizes of the fault detection test set and the fault location test set constructed for an n- variable v-valued linear tree circuit are 1 + ⌈n/(v − 1)⌉ and 1 + ⌈n/ ⌊log2 v⌋ ⌉, respectively. It has been proved that the sizes listed above are optimal for some cases.