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Test Procedure Optimization for Layered Protocol Implementations

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2 Author(s)
T. Kawaoka ; Yokosuka Electrical Communication Laboratory, NTT ; Y. Takahashi

This correspondence describes an algorithm for generating a set of test items and a test sequence which can be used at a minimal cost for testing protocol implementations for a layered protocol. "Set" and "weight" concepts are introduced and "test cost" is defined as the weighted sum of directed arcs.

Published in:

IEEE Transactions on Computers  (Volume:C-34 ,  Issue: 1 )