IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Journals & Magazines > Computers, IEEE Transactions ...> Volume:C-32 Issue:8 Help

A Simplified Method to Calculate Failure Times in Fault-Tolerant Systems

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Seth, S.C. ; Department of Computer Science, University of Nebraska ; Lipsky, L.

A simplified method is presented to calculate moments of failure time and residual lifetime of a fault-tolerant system. The method is based on recent results in queueing theory. Its effectiveness is illustrated by considering a dual repairable system from the literature.

Published in:
Computers, IEEE Transactions on  (Volume:C-32 ,  Issue: 8 )

Date of Publication: Aug. 1983

Page(s):
754 - 756
ISSN :
0018-9340
Digital Object Identifier :
10.1109/TC.1983.1676315
Product Type:
Journals & Magazines
Date of Current Version :
21 August 2006
Issue Date :
Aug. 1983
Sponsored by :
IEEE Computer Society

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.