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Browse Journals & Magazines > Computers, IEEE Transactions ...> Volume:C-32 Issue:6 Help

A Simple Random Test Procedure for Detection of Single Intermittent Fault in Combinational Circuits

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2 Author(s)
Virupakshia, A.R. ; Department of Electrical Engineering, Indian Institute of Technology ; Pratapa Reddy, V.C.V.

This paper suggests a method for near-optimal selection of input vector probabilities for random testing of intermittent faults in combinational circuits. The assignment of input vector probabilities is obtained by equalizing the quality factors of all test vectors in a simple way. It is shown that the degree of fault detection is comparable with that of Savir [2].

Published in:
Computers, IEEE Transactions on  (Volume:C-32 ,  Issue: 6 )

Date of Publication: June 1983

Page(s):
594 - 597
ISSN :
0018-9340
Digital Object Identifier :
10.1109/TC.1983.1676283
Product Type:
Journals & Magazines
Date of Current Version :
21 August 2006
Issue Date :
June 1983
Sponsored by :
IEEE Computer Society

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