Cart (Loading....) | Create Account
Close category search window
 

Code Constructions for Error Control in Byte Organized Memory Systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Dunning, L.A. ; Department of Computer Science, Bowling Green State University ; Varanasi, M.R.

Error correcting codes, such as Hamming codes, have been used successfully to correct errors arising from failures in computer memories. Failure of a chip or card can cause errors which exceed the capabilities of these codes. We construct codes which detect any byte error and correct such errors if they are single random errors. A subclass of the codes developed is shown to have the additional capability of detecting double errors. These codes are intended for use when data are packaged on a byte per chip or a byte per card basis. The codes require fewer check bits than any previously known to the authors except when the byte length or number of bytes is small.

Published in:

Computers, IEEE Transactions on  (Volume:C-32 ,  Issue: 6 )

Date of Publication:

June 1983

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.