By Topic

Greedy Diagnosis as the Basis of an Intermittent-Fault/ Transient-Upset Tolerant System Design

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Dahbura, A.T. ; Department of Electrical Engineering and Computer Science, The Johns Hopkins University ; Masson, G.M.

Multiple-unit computer systems which are to be tolerant of intermittently faulty units or transiently upset units are considered in this paper. Designs for such systems, which exploit a new so-called greedy diagnosis theory, are developed. Using greedy diagnosis, assessments on the condition of a unit (intermittent-fault case) or the integrity of data (transient-upset case) can be made on the basis of syndromes formed from comparisons of the results of jobs performed by pairs of units. Greedy diagnosis avoids the requirement that for such syndromes to be useful, they must be interpretable from a permanent-fault/continuous-upset perspective.

Published in:

Computers, IEEE Transactions on  (Volume:C-32 ,  Issue: 10 )