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Fault Diagnosis in a Boolean n Cube Array of Microprocessors

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2 Author(s)
Armstrong, J.R. ; Department of Electrical Engineering, Virginia Polytechnic Institute and the State University of Virginia ; Gray, F.G.

Fault- tolerant characteristics of a Boolean n cube array of microprocessors are analyzed. Connectivity properties of the network graph are used to show that n processor or link failures are required to isolate a processor. For processor failures the network is shown to be n (one step) diagnosable. A testing algorithm is presented which can diagnose up to n processor failures.

Published in:

Computers, IEEE Transactions on  (Volume:C-30 ,  Issue: 8 )