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Defect Level as a Function of Fault Coverage

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2 Author(s)
Williams, T.W. ; General Technology Division, IBM ; Brown, N.C.

This correspondence presents a single equation relating the defect level of LSI chips to the yield and stuck-at-fault coverage with some assumptions. It is assumed that the faults occur randomly on the chips, which implies no clustering. This concept is extended to modules on boards.

Published in:

Computers, IEEE Transactions on  (Volume:C-30 ,  Issue: 12 )