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Design of Self-Checking MOS-LSI Circuits: Application to a Four-Bit Microprocessor

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2 Author(s)
Crouzet, Y. ; Laboratoire d''Automatique et d''Analyse des Systemes du CNRS ; Landrault, C.

Self-checking approaches developed so far deal with a gate level representation of logical circuits. They do not account for constraints which may result from an implementation by integrated circuits. This paper is concerned with such practical problems and their respective significance.

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Computers, IEEE Transactions on  (Volume:C-29 ,  Issue: 6 )