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Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability

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3 Author(s)
J. Galiay ; Société pour l'Etude et la Fabrication de Circuits Intégrés Spéciaux (EFCIS) ; Y. Crouzet ; M. Vergniault

At the end of an IC production line, integrated circuits are generally submitted to three kinds of tests: 1) parametric tests to check electrical characteristics (voltage, current, power consumption), 2) dynamic tests to check response times under nominal operating conditions, and 3) functional tests to check its logical behavior.

Published in:

IEEE Transactions on Computers  (Volume:C-29 ,  Issue: 6 )