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Minimal Detecting Transition Sequences: Application to Random Testing

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2 Author(s)
David, R. ; Laboratoire d''Automatique, Institut National Polytechnique de Grenoble ; Thevenod-Fosse, P.

This paper presents the new notion of minimal detecting transition sequence (MDTS). A detectable fault f in a circuit C is detected by any MDTS in a set Df called detection set associated with f. From a prescribed set of faults, we obtain a list of detection sets. This list of detection sets is calculated once for all, for a given circuit C. Once this list bas been obtained for a circuit, it may be used either to generate a deterministic test sequence, or to calculate random testing lengths within various hypothesis (input vector probabilities).

Published in:

Computers, IEEE Transactions on  (Volume:C-29 ,  Issue: 6 )

Date of Publication:

June 1980

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