Referenced Items are not available for this document.
Intermittent faults in combinational circuits may appear and disappear randomly; hence, their detection requires many repeated applications of test vectors. Since testing reduces the time available for computation, it is necessary to efficiently minimize the time required for a test, while still achieving a high degree of fault detection.
Published in:
Computers, IEEE Transactions on
(Volume:C-29
,
Issue:
5
)
Date of Publication: May 1980
- Page(s):
- 410 - 416
- ISSN :
- 0018-9340
- Digital Object Identifier :
- 10.1109/TC.1980.1675595
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 21 August 2006
- Issue Date :
- May 1980
- Sponsored by :
- IEEE Computer Society
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