Cart (Loading....) | Create Account
Close category search window
 

Acceptable Testing of VLSI Components Which Contain Error Correctors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Cliff, Rodger A. ; NASA Goddard Space Flight Center

If a VLSI chip is partitioned into functional units (FU's) and redundant FU's are added, error correcting codes may be employed to increase the yield and/or reliability of the chip. Acceptable testing is defined to be testing the chip with the error corrector functioning, thus obtaining the maximum increase in yield afforded by the error correction. The acceptable testing theorem shows that the use of coding and error correction in conjunction with acceptable testing can significantly increase the yield of VLSI chips without seriously compromising their reliability.

Published in:

Computers, IEEE Transactions on  (Volume:C-29 ,  Issue: 2 )

Date of Publication:

Feb. 1980

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.