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A class of simple digital system diagnosis algorithms is presented, and two members of the class are examined in detail. The algorithms are based on the assumption that good units can be replaced during the diagnosis process. Information pertaining to the system testing structure is not used by the two principal algorithms, so they can be applied regardless of system structure. The efficiency of the algorithms in terms of good units replaced is analyzed, and they are shown to compare favorably with methods for special case systems that have been proposed by others.