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Symmetry, Automorphism, and Test

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2 Author(s)
Turcat, C. ; CEPHAG, Equipe de Recherche Associée du C.N.R.S. ; Verdillon, A.

This paper shows how network symmetries (or the graph-theory concept of automorphism) can be used to cluster faults into classes and thus simplify the process of finding a test set: tests for these automorphic classes are found by classical methods and then expanded using automorphisms to produce a test-set. The process does not seem more complex than the classical ones. Furthermore, by using a multilevel description, the process is easily extended to networks of modules.

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Computers, IEEE Transactions on  (Volume:C-28 ,  Issue: 4 )