By Topic

A Functional Form Approach to Test Set Coverage in Tree Networks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Agarwal, V.K. ; Department of Electrical and Computer Engineering, Wayne State University ; Masson, G.M.

To efficiently perform the fault analysis of digital networks it is necessary that pertinent fault interrelationships be utilized. However, to determine these fault interrelationships can entail an analysis which is quite complex and thereby reduces the overall advantage of utilizing the gained insights in a fault analysis process. In this paper we suggest an approach to establishing the existence of a certain fault interrelationship relative to test set coverage in tree networks which is based only on the form of the output function. A procedure is given for generating a form expression (called an L-expression) corresponding to that function. A theorem is stated regarding the interpretation of these form expressions relative to test set coverage.

Published in:

Computers, IEEE Transactions on  (Volume:C-28 ,  Issue: 1 )