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Dynamic Testing of Redundant Logic Networks

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1 Author(s)
Siu-Chong Si ; Department of Electrical Engineering, National Taiwan University

This paper is concerned with the detection of redundant leads in redundant logic networks. The concept of dynamic testing is introduced. We shall show that some traditionally caled undetectable faults may become detectable in dynamic testing, or how to make them become detectable in dynamic testing. Conditions for certain redundancies to be definitely untestable are also discussed.

Published in:

IEEE Transactions on Computers  (Volume:C-27 ,  Issue: 9 )