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An Algorithm for Testing Random Access Memories

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2 Author(s)
Knaizuk, J., Jr. ; Department of Computer Science, State University College ; Hartmann, C.R.P.

This correspondence presents an optimal algorithm to detect any single stuck-at-1 (s-a-1), stuck-at-0 (s-a-0) fault in a random access memory using only the n-bit memory address register input and m-bit memory buffer register input and output lines. It is shown that this algorithm requires 4 X 2nmemory accesses.

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Computers, IEEE Transactions on  (Volume:C-26 ,  Issue: 4 )